Microscopy & Spatial Scale
Scale Bar & Distance Measuring Tool
Calibrate physical length scales across SEM microscopy, metallurgical grain micrographs, satellite imagery, and technical schematics.
graph.pngXY Scatter
✨ Auto-detected Bar & Column Chart — Shifted Section
캔버스 작업공간준비 완료
X축 범위
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Y축 범위
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스케일 종류
계열 필터
디지털화된 데이터
실시간 동기화| # | X 값 | Y 값 | 삭제 |
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클릭하여 직접 수정
포인트 수0
X 평균0.0
Y 최댓값0.0
Micron & Nanometer Scales
Calibrate pixels-per-micron ratios using standard SEM and TEM reference bars.
Multi-Segment Lengths
Measure multi-point polyline lengths, particle diameters, and grain boundary aspect ratios.
Angle & Area Measurements
Calculate polygon surface areas and vertex angles with calibrated physical units.