Microscopy & Spatial Scale
Scale Bar & Distance Measuring Tool
Calibrate physical length scales across SEM microscopy, metallurgical grain micrographs, satellite imagery, and technical schematics.
graph.pngXY Scatter
✨ Auto-detected Bar & Column Chart — Shifted Section
Espace CanevasPrêt
Plage Axe X
à
Plage Axe Y
à
Type d'Échelle
Filtre de Série
Données Numérisées
Synchronisation Directe| # | Valeur X | Valeur Y | Suppr. |
|---|
Cliquer pour éditer
Points0
Moyenne X0.0
Pic Y0.0
Micron & Nanometer Scales
Calibrate pixels-per-micron ratios using standard SEM and TEM reference bars.
Multi-Segment Lengths
Measure multi-point polyline lengths, particle diameters, and grain boundary aspect ratios.
Angle & Area Measurements
Calculate polygon surface areas and vertex angles with calibrated physical units.