Microscopy & Spatial Scale
Scale Bar & Distance Measuring Tool
Calibrate physical length scales across SEM microscopy, metallurgical grain micrographs, satellite imagery, and technical schematics.
graph.pngXY Scatter
✨ Auto-detected Bar & Column Chart — Shifted Section
キャンバス ワークスペース準備完了
X軸 範囲
〜
Y軸 範囲
〜
スケール種別
系列フィルター
抽出データ
リアルタイム同期| # | X値 | Y値 | 削除 |
|---|
クリックで直接編集
点数0
X平均0.0
Y最大値0.0
Micron & Nanometer Scales
Calibrate pixels-per-micron ratios using standard SEM and TEM reference bars.
Multi-Segment Lengths
Measure multi-point polyline lengths, particle diameters, and grain boundary aspect ratios.
Angle & Area Measurements
Calculate polygon surface areas and vertex angles with calibrated physical units.